Optical surface profilers, white light interferometers and confocal microscopes are amongst the most advanced optical systems in use within industry. Metrology Resource has the expertise to consult on your most challenging applications and match your needs with optical and tactile systems for the measurement of surface micro structures.

Leveraging a relationship with Breitmeier Messtechnik GmbH, MRC offers 3D profile measurement systems and custom optical solutions to customers within North America.

Optical measurement system and product examples
(links to BMT website)

An autofocus laser sensor can replace existing, traditional displacement and roughness devices. It lends itself to fast non-contact surface profilometry and roughness measurement as well as precise displacement measurement.

An opto-electronic 3D measurement system is for non-contact measurement and analysis of surfaces. The basic configuration includes a precision measurement stand
with granite bridge, translation XY-stages, the autofocus sensor, or alternatively a sensor based on a working principle according to the specific needs of the user (triangulation, white light interferometry, confocal microscopy, conoscopy) and a system controller. The
acquisition of measurement data is achieved using the proprietary BMT 3D software package which runs under Windows XP. Typical applications include: examination of rough and smooth
surfaces; micro-topography of sheet metal, paper, glass, plastics, wafers; dimensional measurement of micromechanical elements; and measurement and calculation of linearity, flatness, step height and roughness.

White light interferometry systems measure surface profiles, roughness, step height,
microstructures and other surface parameters. The instrument was especially developed to meet the requirements of the electronic, automotive and engineering industries and offers
the highest possible optical resolution according to basic physical principles.

Confocal microscopes enable non-contact measurement of surfaces, evaluation and display of the structure. Size of measurement area and accuracy depend upon the microscope
objective used. Larger measurement areas can be obtained by stitching. Individual measurement points are gathered in parallel by use of a special micro-lens disk. The ACM 600 is the only commercially available instrument utilising a micro-lens disk. Compared to a Nipkow disk this special micro lens disk offers a fast optic so that even the measurement of dark surfaces is possible. Unique is the use of an LED as light source thereby avoiding heating-up of the measurement head resulting in almost unlimited lifetime. For fast changes of objectives, the instrument is equipped with an objective turret.

Contact us for more information about BMT optical profilers: